International Year of Chemistry, 2011

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Device for determining the surface activity and range of propagation of microwaves

Idea by Oleg Titov   |   added on Sep 11, 2010 01:18AM Suggestion Suggestion
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In the study of surface phenomena and the only major instrumental parameters are determined by surface tension and contact angle. These indicators were introduced more than 200 years ago and any new inventions in this area was no more.

Device for determining the surface activity and range of propagation of microwaves

 

In the study of surface phenomena and the only major instrumental parameters are determined by surface tension and contact angle. These indicators were introduced more than 200 years ago and any new inventions in this area was no more. The university developed a new method of determining the surface activity, which proposed a device for determining the surface activity.

The basis of the method and device is the use of video cameras to record the size of the drops and changes on the surface of the liquid layer of known thickness on the impact of a drop of surface-active substances (SAS). Observed changes are then processed through a computer program and calculated parameters, which can be characterized by a surface-active agent and surface properties, which is fluid and the properties of the liquid.

The surface activity is expressed by three indicators:

1. For the surface-active substances - the amount of fluid that can move one kilogram of surfactant,

2. For surfaces - the amount of fluid retained in the surface per unit time.

3. For liquids - the velocity of capillary and microwaves.

Analogues method definitions in the literature is not found, so the competitive environment yet.  Consumers can research and educational enterprises in the chemical, food, nanotechnology and other industries and may also be interested in the structure of standardization and metrology.


Topic: science fair, experiments, conferences Audience: consumers can research and educational institutions, the chemical, food, nanotechnology and other industries and may also be interested in the structure of standardization and metrology.
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